• Login
    Search 
    •   ResearchSpace Home
    • College of Agriculture, Engineering and Science
    • School of Chemistry and Physics
    • Physics
    • Search
    •   ResearchSpace Home
    • College of Agriculture, Engineering and Science
    • School of Chemistry and Physics
    • Physics
    • Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Search

    Show Advanced FiltersHide Advanced Filters

    Filters

    Use filters to refine the search results.

    Now showing items 1-1 of 1

    • Sort Options:
    • Relevance
    • Title Asc
    • Title Desc
    • Issue Date Asc
    • Issue Date Desc
    • Results Per Page:
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100
    Thumbnail

    Profile analysis of X-ray powder diffraction data. 

    Naicker, Vishnu Visvanathan. (1988)
    Various strategies have been tested for obtaining integrated intensities from x-ray powder diffractometer data. An asymmetric pseudo-Voigt profile function was used to fit the pattern in the region above 2θ = 35̊ (Cu-Kα ...

    DSpace software copyright © 2002-2013  Duraspace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of ResearchSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsAdvisorsTypeThis CommunityBy Issue DateAuthorsTitlesSubjectsAdvisorsType

    My Account

    LoginRegister

    Discover

    AuthorNaicker, Vishnu Visvanathan. (1)Subject
    Diffraction. (1)
    Theses--Physics. (1)X-rays--Diffraction. (1)... View MoreDate Issued
    1988 (1)
    Has File(s)
    true (1)

    DSpace software copyright © 2002-2013  Duraspace
    Contact Us | Send Feedback
    Theme by 
    @mire NV